Search papers, labs, and topics across Lattice.
This paper presents a coupled digital-twin framework for predictive and autonomous microscopy that separates and links models of sample response and instrument detection. By employing a physics-informed encoder and a deterministic scanner model, the framework accurately predicts outcomes and uncertainties for microscope operations, achieving sub-nanometer accuracy in scanner-driving descriptors. The findings highlight the importance of understanding feedback dynamics and noise amplification, paving the way for enhanced experimental planning in automated microscopy.
Coupled digital twins can transform microscopy by enabling precise predictions of experimental outcomes and uncertainties before actions are taken.
Automated experimentation is moving from closed-loop optimization toward open decision-making, where human or AI planners must forecast the consequences of candidate actions before executing them. Such forecasts require a model of both sides of the experiment: how the sample is likely to respond and what the instrument is likely to detect. We therefore introduce a coupled digital-twin framework that separates these roles and then links them. In this framework, the sample twin encodes material state inferred from prior knowledge and measurements till the moment. The instrument twin captures signal formation, feedback dynamics, and operating constraints based on prior knowledge. When coupled, the two twins estimate expected outcomes, uncertainty, and risk for candidate microscope operations. For amplitude-modulation scanning probe microscopy, we realize this framework with a physics-informed encoder of force-distance curves, a deterministic scanner model of cantilever and feedback dynamics, and sparse learned residual corrections. The encoder first recovers scanner-driving descriptors with sub-nanometer accuracy. The calibrated scanner then reproduces typical traces within a few nanometers and identifies operating-point noise amplification as the main source of mismatch. Supplementary phase analysis localizes residual error to the phase channel, which clarifies where added physics is needed. Together, these results establish coupled sample and instrument twins as a practical foundation for predictive microscope operation and autonomous experimental planning.
