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This paper introduces GenAU, a unified vision-language framework designed for comprehensive industrial anomaly understanding, which integrates image-level detection, pixel-level segmentation, multi-type anomaly detection, and defect analysis. By employing two segmentation tokens that serve as language-grounded queries, GenAU effectively localizes defects while providing interpretable textual descriptions, thereby overcoming the limitations of existing CLIP-based methods. The results demonstrate that GenAU achieves superior image-level detection performance on cross-dataset benchmarks compared to CLIP-based zero-shot approaches, while its segmentation capabilities are competitive with specialized models.
GenAU achieves state-of-the-art image-level anomaly detection while seamlessly integrating pixel-level localization and defect analysis in a single model.
Industrial inspection requires more than binary anomaly detection: a practical system should determine whether an anomaly exists, localize the defective region, identify the defect type, and provide interpretable visual evidence. Existing CLIP-based methods detect and localize anomalies well but offer limited language-level defect understanding, while instruction-tuned vision-language models can describe defects but do not natively produce pixel-level masks. We introduce GenAU, a Generalist vision-language framework for industrial Anomaly Understanding that unifies image-level detection, pixel-level segmentation, multi-type anomaly detection, and defect analysis in a single instruction-following model. GenAU augments a vision-language model with two segmentation tokens, [SEG_defect] and [SEG_normal], whose hidden states act as language-grounded queries over multi-scale visual features for pixel-level localization; the image-level score fuses this map with the decoder's textual normal/defect decision, while the language decoder produces structured defect-aware responses. Trained with a joint language-modeling and segmentation objective, GenAU covers all four tasks within one architecture and recipe, adding zero-shot multi-type detection and language-grounded defect analysis at a quantified cost to detection and segmentation. Across cross-dataset benchmarks, GenAU attains the strongest image-level detection among CLIP-based zero-shot methods on VisA and Real-IAD, with segmentation approaching but not surpassing specialized CLIP baselines.
