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University of Stuttgart, University of Southampton
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GenAU achieves state-of-the-art image-level anomaly detection while seamlessly integrating pixel-level localization and defect analysis in a single model.
Predicting unseen links in knowledge graphs can often hinge on just a single half-link, revealing critical insights into model generalization.
A knowledge graph can serve as a factory's authoritative write-time state, enabling anomaly detection and runtime constraint enforcement in circular manufacturing.
