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This paper details the design and experimental validation of a fast all-digital circuit aimed at correcting voltage droops in VLSI circuits, which are increasingly problematic due to minimized guard bands for energy efficiency. The proposed circuit dynamically adapts clock frequencies to mitigate the effects of voltage droops while addressing the challenge of metastability in droop detection and storage. Experimental results from a test chip demonstrate the circuit's effectiveness, highlighting its potential to enhance operational frequency stability in modern VLSI systems.
Voltage droops can now be corrected in real-time, potentially unlocking higher operational frequencies in energy-efficient VLSI circuits.
Due to the trend towards minimizing guard bands for energy saving purposes, voltage droops are a key limiting factor for the operational frequency of today's VLSI circuits. Adapting clock frequencies dynamically presents the challenge of metastability in the device that detects and stores the existence of voltage droops. We present an implementation of a fast all-digital circuit for adaptive response to droops using the IHP 130 nm process. The description of the design is presented in an accompanying paper. We experimentally validate the functionality of the design on a test chip.
