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This study introduces a super-resolution generative adversarial network (SRGAN) to enhance the throughput of electron backscatter diffraction (EBSD) analyses for Li-ion battery electrode materials. By training the SRGAN on EBSD data of NMC cathode particles, the authors achieved a 5x upscaling factor, resulting in a 25x reduction in acquisition time while maintaining accuracy in critical microstructural metrics. The SRGAN outperformed traditional interpolation methods, particularly in preserving small grains and realistic grain boundaries, thereby enabling more efficient and statistically robust microstructural characterization.
Super-resolution GANs can accelerate EBSD analysis by 25x without sacrificing critical microstructural accuracy, revolutionizing battery material characterization.
Quantitative microstructural characterization of Li-ion battery electrode materials using electron backscatter diffraction (EBSD) has been proven as a critical method for optimizing cell performance. However, the inherently slow nature of EBSD can hinder the throughput of analyses needed for statistical representation of a material microstructure being developed. This work demonstrates a machine learning super-resolution framework using a generative adversarial network (SRGAN) to significantly increase EBSD throughput. The SRGAN model was trained on EBSD data of LiNixMnyCozO2 (NMC) cathode particles to computationally enhance low-resolution datasets and its performance is compared against classical interpolation methods across various upscaling factors (2x to 12x). Both qualitative image metrics and quantitative microstructural analysis verified that the SRGAN systematically outperformed classical methods, particularly in preserving small grains and maintaining realistic grain boundaries. We demonstrate that a 5x upscaling factor, corresponding to a 25x speed-up in acquisition time or a 25x larger field of view, is practical while maintaining acceptable accuracy in key metrics like grain size and shape. For instance, at 5x upscaling, relative errors were +5.7%, +8.2%, and -14.6% on grain area-equivalent diameter, grain maximum sphere-inscribed diameter, and grain boundary length, respectively. The SRGAN methodology developed in this work significantly enhances the efficiency of EBSD acquisition for more statistically robust microstructural dataset, enabling EBSD as a high-throughput characterization tool for materials research and industrial process development.
