Search papers, labs, and topics across Lattice.
This paper introduces FT-Pilot, a GNN-guided LLM framework for automated soft-error hardening of RTL designs. A GNN identifies vulnerable RTL assets, which then guides an LLM-based rewriting engine to perform fault-tolerant code modifications using retrieval-augmented generation and an automatic repair mechanism. Experiments demonstrate that FT-Pilot generates hardened RTL designs that are syntactically correct, functionally correct, and synthesizable, while significantly reducing output error rates in soft-error scenarios.
Automating fault tolerance at the RTL level is now possible: FT-Pilot uses LLMs to rewrite hardware designs, slashing error rates without manual intervention.
As integrated circuit technologies continue to scale toward advanced process nodes, the continual reduction in node capacitance and supply voltage has made digital systems increasingly vulnerable to soft errors. Although traditional full-chip hardening methods can improve reliability, they often incur unacceptable area and power overhead, making selective hardening a more practical engineering solution. However, existing approaches typically rely on time-consuming fault-injection simulation to determine hardening locations through vulnerability analysis, and still depend heavily on manual strategy selection and RTL modification during the hardening stage, making them ill-suited for efficient automated reliability optimization at early design stages. To address these challenges, this paper proposes FT-Pilot, a GNN-guided LLM framework for automatic RTL soft-error hardening. The framework first employs a GNN to identify critical vulnerable assets directly at the RTL level, and then introduces an LLM-driven rewriting engine composed of an analyzer and a rewriter, which performs RTL-level fault-tolerant code rewriting with the support of dual-knowledge-base retrieval-augmented generation and an automatic repair mechanism. Experimental results show that the proposed framework can automatically generate hardened RTL designs that are syntactically correct, functionally correct, and synthesizable across multiple benchmark circuits, while significantly reducing output error rates under soft-error scenarios. This work provides a practical automated path toward shift-left reliability optimization at the RTL level.
