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This paper applies and compares Integrated Gradients (IG) and SHAP to explain fault diagnosis decisions made by an LSTM classifier trained to detect faults in the Tennessee Eastman Process (TEP). The study demonstrates how these XAI methods can pinpoint the process subsystem where a fault originates. Results indicate that both methods generally identify similar key features, with SHAP occasionally providing more insightful explanations closer to the fault's root cause.
SHAP and Integrated Gradients can pinpoint faulty subsystems in chemical processes, but SHAP may get you closer to the root cause.
In this work, we apply and compare two state-of-the-art eXplainability Artificial Intelligence (XAI) methods, the Integrated Gradients (IG) and the SHapley Additive exPlanations (SHAP), that explain the fault diagnosis decisions of a highly accurate Long Short-Time Memory (LSTM) classifier. The classifier is trained to detect faults in a benchmark non-linear chemical process, the Tennessee Eastman Process (TEP). It is highlighted how XAI methods can help identify the subsystem of the process where the fault occurred. Using our knowledge of the process, we note that in most cases the same features are indicated as the most important for the decision, while insome cases the SHAP method seems to be more informative and closer to the root cause of the fault. Finally, since the used XAI methods are model-agnostic, the proposed approach is not limited to the specific process and can also be used in similar problems.
