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This study addresses the challenge of localizing X-ray fluorescence (XRF) fields of view within optical microscopy images by formalizing a method for whole-group localization based on acquisition geometry. By employing group intersection-over-union (GroupIoU) as a metric, the researchers demonstrated a significant improvement in localization accuracy, achieving a GroupIoU of 0.931 compared to 0.000 with independent localization. Additionally, the use of mutual information as a similarity metric yielded comparable results, reinforcing the effectiveness of the proposed approach across different metrics and emphasizing the benefits of integrating coarse XRF survey scans with fine-scale optical images.
Group localization of XRF tiles can boost accuracy from zero to nearly perfect by leveraging acquisition geometry, transforming how we integrate multimodal imaging data.
X-ray fluorescence (XRF) microscopy maps elemental distributions, while optical microscopy can provide complementary morphological context. Localizing XRF fields of view (FOVs) in optical images is difficult because the two modalities differ in contrast mechanism and resolution. Most current workflows place each XRF tile independently, even when acquisition metadata already record the tiles' relative scan positions. This study formalizes XRF tile-group localization, in which one optical-frame placement is estimated for the whole group, constrained by acquisition geometry and quantified using group intersection-over-union (GroupIoU). In a controlled case study, independent localization failed with GroupIoU 0.000, whereas group localization achieved 0.931. Replacing the normalized cross-correlation (NCC) metric with mutual information (MI) gave nearly identical results, showing that the outcome is not specific to one local similarity metric. In another multiscale case study, using a coarse XRF survey scan to connect the fine-scale tile group to the optical image increased mean GroupIoU from 0.694 to 0.856. These case studies support using acquisition geometry as an explicit constraint when localizing related XRF tiles.
