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This paper conducts a thorough soft-error characterization and hardening trade-off analysis for static Pre-Charge Half Buffer (PCHB) asynchronous circuits, which are essential for reliable operation in harsh environments. Utilizing a controlled transistor-level fault-injection framework, the authors identify vulnerability nodes and evaluate four mitigation strategies鈥攄ouble-sided Schmitt trigger, single-sided Schmitt trigger, transmission-gate reinforcement, and duplication-based redundancy鈥攁cross various PCHB cells. The findings provide architecture-specific guidelines for enhancing resilience while balancing delay, energy, and area overheads, crucial for the design of robust asynchronous circuits.
Identifying vulnerability nodes in PCHB circuits reveals that targeted hardening strategies can significantly enhance resilience without excessive overhead.
Pre-Charge Half Buffer (PCHB) is a promising asynchronous digital design paradigm for harsh-environment operation; however, its soft-error characteristics remain largely unexplored. This paper presents a systematic soft-error characterization and hardening trade-off analysis for static PCHB circuits. A controlled transistor-level fault-injection framework is developed to extract polarity-dependent critical charge at internal nodes. Vulnerability nodes are identified based on extensive simulation. Four mitigation strategies, double-sided Schmitt trigger, single-sided Schmitt trigger, transmission-gate reinforcement, and duplication-based redundancy, are implemented and evaluated across five representative PCHB cells. Comprehensive resilience-overhead comparisons in delay, energy, and area are reported, leading to architecture-specific hardening guidelines for robust static PCHB design.
