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This study addresses the challenge of limited labeled data in analyzing microstructural defects in transmission electron microscopy (TEM) images by employing a mask-conditioned latent diffusion model (LDM) for generative data augmentation. The approach synthesizes realistic TEM images along with automatically labeled multi-class defect masks, enabling the creation of synthetic image-mask pairs without manual annotations. Results indicate that this generative augmentation can improve model performance, achieving up to a 0.02 increase in the harmonic mean of F1 scores for defect detection and classification, with varying contributions depending on the data split used for training and testing.
Generative data augmentation can enhance defect detection in TEM images, even with small labeled datasets, revealing nuanced improvements based on data splits.
Analyzing microstructural defects in transmission electron microscopy (TEM) images, particularly in irradiated metal alloys, is often limited by the availability of high-quality, labeled data. To address this, we introduce a generative data augmentation approach using a mask-conditioned latent diffusion model (LDM) for synthesizing realistic TEM images with controllable, automatically labeled multi-class defect masks. Without requiring manual annotations for generation, our method enables the creation of synthetic image-mask pairs by sampling distributions learned from experimental masks. These generated data were used to augment small experimental datasets of varying sizes (10, 50, and 100 labeled experimental images) to train a Mask Regional Convolutional Neural Network (R-CNN) model for defect detection and classification. Our results show that generative augmentation yields small overall model performance improvements, with up to a 0.02 gain in the harmonic mean of detection and classification F1 scores. However, we also find that the relative contributions to detection and classification improvement depend on the specific train/test data split. These findings highlight the potential of targeted generative models to enhance deep learning performance in data-scarce microscopy-based image quantification tasks.
