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This paper introduces a multi-level framework for evaluating the integrity of quantum circuits, addressing the limitations of relying solely on structural or behavioral analysis. The framework combines a Structural Integrity Score (SIS), Operational Integrity Score (OIS), and Interaction Graph Semantic-Logical Score (IGS) to capture different aspects of circuit deviation. Through anomaly injection experiments, the authors demonstrate that the three metrics provide complementary insights, with OIS and IGS effectively detecting anomalies in cases where structural similarity (SIS) fails.
Structural similarity can be dangerously misleading in quantum circuits: even with 95% structural integrity, behavioral anomalies can be rampant.
Ensuring the integrity of quantum circuits is a significant challenge in the Noisy Intermediate-Scale Quantum (NISQ) era, where circuits are subject to compilation transformations, hardware constraints, and potential adversarial modifications. Existing validation approaches typically rely on either structural analysis or behavioral evaluation, leading to incomplete assessment of circuit correctness. In this work, we investigate the relationship between structural, interaction-level, and behavioral perspectives of circuit integrity, demonstrating that a single aspect of integrity is insufficient to guarantee circuit integrity; structural similarity alone does not ensure behavioral equivalence. To address this problem, we use a three-layer metric framework that combines the Structural Integrity Score (SIS), the Operational Integrity Score (OIS), and the Interaction Graph Semantic-Logical Score (IGS). SIS captures global structural properties, OIS quantifies behavioral divergence using Jensen-Shannon distance, and IGS models interaction patterns and dependencies in a pre-execution setting. Through controlled anomaly injection on benchmark quantum circuits, we demonstrate that each metric captures a different aspect of circuit deviation. In particular, structural blind-spot cases (SIS >= 0.95) reveal a clear limitation of structural analysis, where OIS detects anomalies in 93.85% of instances, while IGS detects 72.58%. These results highlight that the metrics provide complementary insights and that a single metric is insufficient for reliable circuit validation.
