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This paper introduces a self-supervised Mixture of Experts (MoE) transformer-based foundation model pre-trained on a large dataset of diverse SEM images to enable generalization across materials and imaging conditions. The model learns transferable representations, which are then fine-tuned for defocus-to-focus image translation, a critical task in automated microscopy. The resulting model outperforms existing state-of-the-art methods in restoring focused detail from defocused SEM images without paired supervision.
A single foundation model can now generalize across diverse materials and imaging conditions in Scanning Electron Microscopy, enabling automated focus restoration and accelerating materials discovery.
Scanning Electron Microscopy (SEM) is indispensable in modern materials science, enabling high-resolution imaging across a wide range of structural, chemical, and functional investigations. However, SEM imaging remains constrained by task-specific models and labor-intensive acquisition processes that limit its scalability across diverse applications. Here, we introduce the first foundation model for SEM images, pretrained on a large corpus of multi-instrument, multi-condition scientific micrographs, enabling generalization across diverse material systems and imaging conditions. Leveraging a self-supervised transformer architecture, our model learns rich and transferable representations that can be fine-tuned or adapted to a wide range of downstream tasks. As a compelling demonstration, we focus on defocus-to-focus image translation-an essential yet underexplored challenge in automated microscopy pipelines. Our method not only restores focused detail from defocused inputs without paired supervision but also outperforms state-of-the-art techniques across multiple evaluation metrics. This work lays the groundwork for a new class of adaptable SEM models, accelerating materials discovery by bridging foundational representation learning with real-world imaging needs.
