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This paper reviews the limitations of current rule-based electromigration (EM) checks in integrated circuits and advocates for the adoption of physics-based models for more accurate analysis. It contrasts physics-based EM models with empirical approaches, highlighting the advantages of the former in capturing complex physical phenomena. The paper identifies key challenges that need to be addressed to facilitate the transition of physics-based EM analysis and optimization from research to practical application in future integrated systems.
Rule-based electromigration checks are no longer sufficient; physics-based models are ready for prime time, but several open problems must be solved to enable their practical adoption in integrated circuit design.
Electromigration, a significant lifetime reliability concern in highperformance integrated circuits, is projected to grow even more important in future heterogeneously integrated systems that will service higher current loads. Today, EM checks are primarily based on rule-based methods, but these have known limitations. In recent years, there has been remarkable progress in enabling fast EM computations based on more accurate physics-based models, but such methods have not yet moved from research to practice. This paper overviews physics-based EM models, contrasts them with empirical models, and outlines several open problems that must be solved in order to enable accurate physics-based and circuit-aware EM analysis and optimization in future integrated systems.
