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This paper introduces an agentic AI-driven workflow leveraging LLM-enabled Generative AI to automate coverage analysis in formal verification, identify coverage gaps, and generate formal properties to address these gaps. The approach aims to improve verification efficiency by systematically closing coverage holes that traditional methods struggle with. Experiments on open-source and internal designs demonstrate a measurable increase in coverage metrics, particularly for complex designs, validating the effectiveness of the proposed AI-based coverage closure technique.
LLMs can now autonomously identify and patch coverage holes in formal verification, potentially revolutionizing IC development workflows.
Coverage closure is a critical requirement in Integrated Chip (IC) development process and key metric for verification sign-off. However, traditional exhaustive approaches often fail to achieve full coverage within project timelines. This study presents an agentic AI-driven workflow that utilizes Large Language Model (LLM)-enabled Generative AI (GenAI) to automate coverage analysis for formal verification, identify coverage gaps, and generate the required formal properties. The framework accelerates verification efficiency by systematically addressing coverage holes. Benchmarking open-source and internal designs reveals a measurable increase in coverage metrics, with improvements correlated to the complexity of the design. Comparative analysis validates the effectiveness of this approach. These results highlight the potential of agentic AI-based techniques to improve formal verification productivity and support comprehensive coverage closure.
