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This paper addresses the problem of drift localization, which is critical for understanding and mitigating the impact of concept drift in learning systems. The authors propose a novel approach based on conformal predictions to identify samples affected by drift, overcoming the limitations of local testing schemes in high-dimensional, low-signal scenarios. Experiments on image datasets demonstrate the superior performance of the conformal prediction-based method compared to existing techniques.
Conformal prediction offers a surprisingly effective way to pinpoint exactly which samples are most affected by concept drift, even when traditional methods struggle in complex data.
Concept drift -- the change of the distribution over time -- poses significant challenges for learning systems and is of central interest for monitoring. Understanding drift is thus paramount, and drift localization -- determining which samples are affected by the drift -- is essential. While several approaches exist, most rely on local testing schemes, which tend to fail in high-dimensional, low-signal settings. In this work, we consider a fundamentally different approach based on conformal predictions. We discuss and show the shortcomings of common approaches and demonstrate the performance of our approach on state-of-the-art image datasets.
