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This work introduces an empirical model that analytically connects the parameters of the extended Kubo-Toyabe (KT) function, accounting for ion jump diffusion via the Edwards-Anderson parameter $Q$, to those of the conventional KT function. The model successfully explains and corrects for anomalous temperature dependencies in linewidth and fluctuation rate observed when analyzing $μ$SR data with the conventional KT function. Application to battery materials literature demonstrates accurate derivation of ion diffusion activation energies and pre-exponential factors, validating the transformation of analysis artifacts into a diagnostic tool.
Peculiar artifacts in $μ$SR data analysis of ion diffusion are revealed to be a direct, quantifiable signature of ion dynamics, enabling accurate extraction of diffusion parameters.
We present an empirical model that analytically relates the parameters of the extended Kubo-Toyabe (KT) function $G_z^{\rm EA}(t;Δ,ν_{\rm i},Q)$, which describes muon spin relaxation ($μ$SR) induced by jump diffusion of ions using the Edwards-Anderson parameter $Q$, to those of the conventional KT function $G_z^{\rm KT}(t;Δ_{\rm KT},ν_{\rm KT})$ that serves as an approximation of $G_z^{\rm EA}(t)$. The proposed formulae successfully reproduce the anomalous temperature dependences of the linewidth $Δ_{\rm KT}(T)$ and the fluctuation rate $ν_{\rm KT}(T)$ which are artifacts observed upon analyzing $μ$SR data on ion diffusion using $G_z^{\rm KT}(t)$. Applying this model to $Δ_{\rm KT}$ and $ν_{\rm KT}$ published in the literature of battery materials yields activation energy $E_{\rm i}$ and pre-exponential factor $ν_{\rm i0}$ in the Arrhenius equation for ion diffusion, $ν_{\rm i}(T)=ν_{\rm i0} e^{-E_{\rm i}/kT}$, that are in excellent agreement with those deduced using other techniques, transforming peculiar artifacts into a powerful diagnostic tool.