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David Williams, Ioakim Avraam, Justyna Petke, and Federica Sarro are with the Department of Computer Science, University College London, London, UK (e-mail: {david.williams.22,j.petke,f.sarro}@ucl.ac.uk).Aldeida Aleti is with the Department of Software Systems & Cybersecurity, Monash University, Melbourne, Australia (e-mail: aldeida.aleti@monash.edu).M. Martinez is with the Universitat Polit猫cnica de Catalunya, Barcelona, Spain (e-mail: matias.martinez@upc.edu).This work has been submitted to the IEEE for possible publication. Copyright may be transferred without notice, after which this version may no longer be accessible
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Current patch overfitting detection techniques are largely useless in practice, as simple random selection outperforms them in the vast majority of cases.
