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The paper introduces Analog-DB, an open-source database designed to facilitate the sharing and reuse of analog integrated circuit designs by employing a domain-specific language that captures designs as process-neutral topologies. This approach allows for the integration of reusable testbenches and machine-readable datasheets, enabling AI design agents to discover and retarget circuits effectively. Key results show that while 10 out of 23 circuit-kit bindings met their specifications, a supervised coding agent was able to identify critical defects in op-amp cores that traditional sizing methods overlooked, demonstrating the practical utility of the database in improving design accuracy.
AI design agents can now directly discover and reuse analog circuit designs, significantly enhancing the efficiency of circuit development and defect detection.
Sharing analog integrated circuit designs remains difficult: foundry non-disclosure agreements restrict the process details a design depends on, and the testbenches behind published results are rarely released. We present analog-db, an open-source, versioned database built on a shareable design representation. A domain-specific language captures each design as a process-neutral topology, reusable testbenches, and a machine-readable datasheet under one schema, so a design is shared in full and re-simulates on the process kits it is bound to. A parameterization scheme exposes functional sub-blocks and device sizes as named parameters that carry their matching constraints, making circuits composable and retargetable; a schema-governed contract and queryable catalog let AI design agents discover and reuse them directly. Across the regulator corpus, all 23 circuit-kit bindings on three open kits meet their own recorded specification bands (typical corner, matched devices, no layout) and 10 of 23 meet a common class band. Seventeen of the 23 imported sizings failed their testbenches and closed under a gm/ID sizing loop driven by the annotated sub-block roles, typically within one to three iterations. In a supervised case study, a coding agent working from the released artifacts sized the op-amp cores of a chopper instrumentation amplifier on an open 130nm kit, locating four hand-entry defects and a missing common-mode feedback loop that the sizing-only baseline did not repair. The database holds 68 circuits across sixteen classes, verifiable at schematic level under a tiered harness and tracked on a power/performance scoreboard, released at https://github.com/MacAnalog/spicexplorer-release.