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This work designs an end-to-end, fully analog signal processing and neural network pipeline for ultrasonic damage detection that bypasses analog-to-digital converters and digital microprocessors. Traditional edge ML pipelines demand high transistor counts and power budgets that make integration into printed organic electronics or zero-power structural health monitoring infeasible. By combining all-pass filter networks for Hilbert-transform envelope extraction with analog arithmetic and an analog artificial neural network, the architecture executes full defect classification within an extreme budget of fewer than 100 transistors.
Edge ML inference does not require digital processors: an entire ultrasonic damage-detection pipeline—from Hilbert-transform feature extraction to neural classification—can operate purely in continuous-time analog circuits using under 100 transistors.
Ultrasonic Testing (UT) is commonly used to detect damage in structures, e.g., metal plates. A sensor acquires Ultrasonic waves, e.g., by using PZT transducers. The time-resolved sensor signal must be processed with analog electronics, e.g., amplified and filtered. Commonly a digitalization follows using an Analog-to-Digital converter, finally processing the digital sensor signal, applying digital signal processing, feature extraction, and Machine Learning by using powerful microprocessor systems. The disadvantages of digital processing systems are their high number of transistors (microchip area), energy consumption, state-dependent processing and therefore sensitivity to energy supply interruption. Beyond silicon electronics, printed organic electronics gains interest. But printed electronics is still limited to low transistor and electronic component counts (typically 100). We will investigate and demonstrate a fully analog signal processing and feature extraction system consisting of an analog Hilbert transform deriving the signal envelope, simple analog arithmetic calculations for feature extraction, and finally damage classification and regression using an analog Artificial Neural Network. We expect a full damage detection system with less than 100 transistors. We will test our damage detection system with PZT transducer signals from Steel plates with circular defects. The focus of this work is the analog computation of the signal envelope (using all-pass filter networks for approximation of the Hilbert transform) and the analog feature extraction as well as the prediction of damage, forming an analog computer which can perform in-sensor computation, computing without a digital computer.