Search papers, labs, and topics across Lattice.
This study evaluates the performance of continuous-variable (CV) and discrete-variable (DV) quantum neural networks (QNNs) for wafer-map defect classification, crucial for semiconductor yield enhancement. Using a shared convolutional backbone and interchangeable heads, the research reveals that the CV paradigm significantly outperforms DV, achieving an accuracy of 79.7% compared to 61.6% for DV, particularly excelling in distinguishing closely related defect types. The findings highlight the importance of structured layers and continuous phase-space encoding in QNNs, suggesting that CV may be more suitable for specific industrial applications in quantum computing.
CV quantum neural networks achieve an 18-point accuracy advantage over their DV counterparts in wafer-map defect classification, revealing critical insights for semiconductor yield improvement.
Realizing quantum neural networks (QNNs) in industry requires knowing which quantum computing paradigm suits which task. Motivated by AI accelerators and high-bandwidth memory, where die stacking makes wafer-level defect screening central to yield, we study WM-811K wafer-map defect classification (eight classes), comparing the dominant paradigms, continuous-variable (CV) and discrete-variable (DV), under controlled conditions. To isolate the quantum circuit as the sole variable, a shared convolutional backbone (~4.3M parameters) feeds interchangeable heads (classical dense, CV-QNN, or DV-QNN) as the only structural difference; each quantum head is scaled over three sizes (3, 4, 8 qumodes/qubits). The CV head consistently outperforms the DV head: at four qumodes/qubits it reaches 79.7 +/- 1.8% accuracy versus 61.6 +/- 1.4%, a non-overlapping 18-point gap. The advantage is sharpest on the spatially localized Edge-Loc class, easily confused with Scratch, which CV recovers with recall 0.66 +/- 0.06 while DV fails at every size (<=0.05), showing the structured CV layer better captures fine spatial distinctions between defect types. Training curves show the DV limitation is a representational-capacity ceiling, not an optimization failure; at the Fock cutoff used here (d = 2) the CV advantage reflects two intrinsic properties, a structured, neural-network-analogue layer and continuous phase-space encoding, not Hilbert-space dimensionality. On IBM hardware, DV accuracy holds at shallow depth, degrading only at the deepest circuit. Both quantum heads remain below the classical baseline (85.0%), but the controlled setting isolates where a structured head already helps and, as noise and scale improve, which paradigm can deliver practical advantage.