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This paper introduces InjectV, a fault injection attack framework designed for RISC-V platforms using the gem5 simulator, which allows for precise and guided fault injections at critical execution points. By enabling systematic exploration of attack vectors, InjectV addresses the challenges of evaluating hardware resilience against Fault Injection Attacks (FIAs) during pre-silicon development, a phase where physical fault experiments are often impractical. Experimental results show that InjectV can identify fault-injection points effectively, achieving a remarkable 95.8% time-saving compared to traditional methods, highlighting its efficiency and utility in hardware security assessments.
InjectV slashes the time needed for fault injection testing by nearly 96%, revolutionizing how we assess hardware security vulnerabilities.
Fault Injection Attacks (FIAs) are a significant threat to hardware security, capable of compromising systems by inducing malicious faults in computation or storage. Evaluating resilience against such attacks is challenging due to the high cost, complexity, and limited availability of physical fault experiments, particularly during pre-silicon development. Architectural-level simulation offers a developer-oriented, white-box perspective for systematic vulnerability assessment. This paper introduces InjectV, a fault injection attack framework for RISC-V platforms built on the gem5 simulator. InjectV enables precise, guided fault injection at security-critical execution points, such as control-flow decisions, counters, and comparisons, allowing systematic exploration of attack vectors. It currently supports transient fault attacks in registers and memory, broadening its ability to simulate diverse attack scenarios. Experimental results on security benchmarks from the FISSC suite, including hardened variants of the VerifyPIN application, demonstrate InjectV's ability to effectively identify fault-injection points, achieving a 95.8% time-saving advantage over traditional fault injection approaches.